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Review of Recent Advances in Gas-Assisted Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry (FIB-TOF-SIMS).
Materials (Basel). 2023 Mar 3;16(5):2090. doi: 10.3390/ma16052090.
Materials (Basel). 2023.
PMID: 36903205
Free PMC article.
Review.
In Situ Time-of-Flight Mass Spectrometry of Ionic Fragments Induced by Focused Electron Beam Irradiation: Investigation of Electron Driven Surface Chemistry inside an SEM under High Vacuum.
Jurczyk J, Pillatsch L, Berger L, Priebe A, Madajska K, Kapusta C, Szymańska IB, Michler J, Utke I.
Jurczyk J, et al.
Nanomaterials (Basel). 2022 Aug 6;12(15):2710. doi: 10.3390/nano12152710.
Nanomaterials (Basel). 2022.
PMID: 35957140
Free PMC article.
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