A pot experiment with twenty wheat cultivars was conducted to investigate the superoxide dismutase (SOD), peroxidase (POD), and catalase (CAT) activities and the MDA, soluble protein and soluble sugar contents of functional leaves as well as the grain yield, 1000-grain weight, and grain morphological characters under low temperature stress. Low temperature (-4 degrees C) stress at stem elongation stage resulted in the changes of grain morphology and yield characters. For most of test cultivars, their grain length-width ratio, grain roundness, and sterile spikelets increased, and their grain equivalent diameter, grain area, 1000-grain weight, and grain yield decreased. Path analysis indicated that after treated with low temperature at stem elongation stage, the SOD activity and soluble sugar content of functional leaves, especially the SOD activity (direct path coefficient -0. 578) , were the dominant factors affecting grain yield. Taking the percentage of decreased grain yield due to low temperature stress as the assessment criterion, the test twenty winter wheat cultivars were divided into three groups. Cultivars Jimai 19, Jimai 20, Liangxing 99, Shannong 1135, Shannong 8355, Taishan 23, Taishan 9818, Wennong 6, and Yannong 21 belonged to high freeze resistance group, cultivars Linmai 2, Weimai 8, Yannong 19, and Zimai 12 were of low freeze resistance group, and the other seven cultivars belonged to medium freeze resistance group. The seedling stage comprehensive assessment index (D value) had a significant negative correlation with the percentage of decreased grain yield (r = -0. 512*), suggesting that the stronger freeze resistance of wheat at seedling stage was beneficial to the higher wheat grain yield, and seedling stage was the critical period to be selected to identify the freeze resistance of wheat.