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Page 1
Optimized Design of a Pump Laser System for a Spin Exchange Relaxation Free Inertial Measurement Device.
Sensors (Basel). 2021 Apr 23;21(9):2982. doi: 10.3390/s21092982.
Sensors (Basel). 2021.
PMID: 33922840
Free PMC article.
Prediction of lifetime by lumen degradation and color shift for LED lamps, in a non-accelerated reliability test over 20,000 h.
Hao J, Ke HL, Jing L, Sun Q, Sun RT.
Hao J, et al. Among authors: ke hl.
Appl Opt. 2019 Mar 1;58(7):1855-1861. doi: 10.1364/AO.58.001855.
Appl Opt. 2019.
PMID: 30874228
Item in Clipboard
Disparity between online and offline tests in accelerated aging tests of LED lamps under electric stress.
Wang Y, Jing L, Ke HL, Hao J, Gao Q, Wang XX, Sun Q, Xu ZJ.
Wang Y, et al. Among authors: ke hl.
Appl Opt. 2016 Sep 20;55(27):7511-6. doi: 10.1364/AO.55.007511.
Appl Opt. 2016.
PMID: 27661576
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Comparison of online and offline tests in LED accelerated reliability tests under temperature stress.
Ke HL, Jing L, Gao Q, Wang Y, Hao J, Sun Q, Xu ZJ.
Ke HL, et al.
Appl Opt. 2015 Nov 20;54(33):9906-10. doi: 10.1364/AO.54.009906.
Appl Opt. 2015.
PMID: 26836556
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Analysis of junction temperature and modification of luminous flux degradation for white LEDs in a thermal accelerated reliability test.
Ke HL, Jing L, Hao J, Gao Q, Wang Y, Wang XX, Sun Q, Xu ZJ.
Ke HL, et al.
Appl Opt. 2016 Aug 1;55(22):5909-16. doi: 10.1364/AO.55.005909.
Appl Opt. 2016.
PMID: 27505370
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Lumen degradation analysis of LED lamps based on the subsystem isolation method.
Ke HL, Hao J, Tu JH, Miao PX, Wang CQ, Cui JZ, Sun Q, Sun RT.
Ke HL, et al.
Appl Opt. 2018 Feb 1;57(4):849-854. doi: 10.1364/AO.57.000849.
Appl Opt. 2018.
PMID: 29400749
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