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zhongke xie
(1 results)?
High-performance multi-parameter fiber sensor by grating-enhanced Mach-Zehnder interference.
Opt Lett. 2022 Oct 15;47(20):5365-5368. doi: 10.1364/OL.472532.
Opt Lett. 2022.
PMID: 36240364
Fast structured illumination microscopy with reflectance disturbance resistibility and improved accuracy.
Xie Z, Tang Y, He Y, Liu J, Feng J, Hu S.
Xie Z, et al.
Opt Express. 2019 Jul 22;27(15):21508-21519. doi: 10.1364/OE.27.021508.
Opt Express. 2019.
PMID: 31510227
Free article.
Item in Clipboard
Surface and thickness measurement of transparent thin-film layers utilizing modulation-based structured-illumination microscopy.
Xie Z, Tang Y, Zhou Y, Deng Q.
Xie Z, et al.
Opt Express. 2018 Feb 5;26(3):2944-2953. doi: 10.1364/OE.26.002944.
Opt Express. 2018.
PMID: 29401827
Free article.
Item in Clipboard
Fast structured illumination microscopy with a large dynamic measurement range.
Han C, Tang Y, Xie Z, Liu L, Feng J, Hu S.
Han C, et al. Among authors: xie z.
Appl Opt. 2021 Jun 10;60(17):5169-5176. doi: 10.1364/AO.424081.
Appl Opt. 2021.
PMID: 34143086
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Accurate surface profilometry using differential optical sectioning microscopy with structured illumination.
Xie Z, Tang Y, Feng J, Liu J, Hu S.
Xie Z, et al.
Opt Express. 2019 Apr 15;27(8):11721-11733. doi: 10.1364/OE.27.011721.
Opt Express. 2019.
PMID: 31053014
Free article.
Item in Clipboard
Fast surface profilometry utilizing structured illumination microscopy based on the time-domain phase-shift technique.
Liu L, Tang Y, Xie Z, Feng J, He Y, Hu S.
Liu L, et al. Among authors: xie z.
Appl Opt. 2019 Oct 20;58(30):8180-8186. doi: 10.1364/AO.58.008180.
Appl Opt. 2019.
PMID: 31674488
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