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Page 1
Analysis of Meridian Flow Direction by Electrical Stimulation Method.
Liu YW, Kuo CW, Chang TC, Hung YC, Tan YF, Wu CC, Lin CH, Chen WC, Hu WL, Tsai TM. Liu YW, et al. Among authors: tsai tm. Nanoscale Res Lett. 2022 Jul 8;17(1):64. doi: 10.1186/s11671-022-03694-4. Nanoscale Res Lett. 2022. PMID: 35802273 Free PMC article.
Physical and chemical mechanisms in oxide-based resistance random access memory.
Chang KC, Chang TC, Tsai TM, Zhang R, Hung YC, Syu YE, Chang YF, Chen MC, Chu TJ, Chen HL, Pan CH, Shih CC, Zheng JC, Sze SM. Chang KC, et al. Among authors: tsai tm. Nanoscale Res Lett. 2015 Mar 12;10:120. doi: 10.1186/s11671-015-0740-7. eCollection 2015. Nanoscale Res Lett. 2015. PMID: 25873842 Free PMC article.
Resistance Switching Characteristics Induced by O2 Plasma Treatment of an Indium Tin Oxide Film for Use as an Insulator in Resistive Random Access Memory.
Chen PH, Chang TC, Chang KC, Tsai TM, Pan CH, Chen MC, Su YT, Lin CY, Tseng YT, Huang HC, Wu H, Deng N, Qian H, Sze SM. Chen PH, et al. Among authors: tsai tm. ACS Appl Mater Interfaces. 2017 Jan 25;9(3):3149-3155. doi: 10.1021/acsami.6b14282. Epub 2017 Jan 10. ACS Appl Mater Interfaces. 2017. PMID: 28072511
19 results