Understanding Inherent Structural Defects at Topological Superconductor Interfaces using Advanced Electron Microscopy
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):1686.
doi: 10.1093/micmic/ozad067.867.
Authors
Rosa E Diaz
1
,
Tiang Wang
2
,
Michael Capano
1
3
,
Michael Manfra
1
2
3
Affiliations
1
Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana, USA.
2
Department of Physics and Astronomy, Purdue University, West Lafayette, Indiana, USA.
3
Department of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana, USA.
PMID:
37613793
DOI:
10.1093/micmic/ozad067.867
No abstract available