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Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor.
Sensors (Basel). 2023 Sep 18;23(18):7959. doi: 10.3390/s23187959.
Sensors (Basel). 2023.
PMID: 37766015
Free PMC article.
Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method.
Chao CY, Tu H, Wu TM, Chou KY, Yeh SF, Yin C, Lee CL.
Chao CY, et al. Among authors: wu tm.
Sensors (Basel). 2017 Nov 23;17(12):2704. doi: 10.3390/s17122704.
Sensors (Basel). 2017.
PMID: 29168778
Free PMC article.
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