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Bulk and surface recombination properties in thin film semiconductors with different surface treatments from time-resolved photoluminescence measurements.
Sci Rep. 2019 Mar 29;9(1):5385. doi: 10.1038/s41598-019-41716-x.
Sci Rep. 2019.
PMID: 30926885
Free PMC article.
Voltage dependent admittance spectroscopy for the detection of near interface defect states for thin film solar cells.
Weiss TP, Nishiwaki S, Bissig B, Buecheler S, Tiwari AN.
Weiss TP, et al.
Phys Chem Chem Phys. 2017 Nov 22;19(45):30410-30417. doi: 10.1039/c7cp05236g.
Phys Chem Chem Phys. 2017.
PMID: 29131204
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