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Omnipresence of Weak Antilocalization (WAL) in Bi2Se3 Thin Films: A Review on Its Origin.
Nanomaterials (Basel). 2021 Apr 22;11(5):1077. doi: 10.3390/nano11051077.
Nanomaterials (Basel). 2021.
PMID: 33922019
Free PMC article.
Review.
Ion-Induced Lateral Damage in the Focused Ion Beam Patterning of Topological Insulator Bi2Se3 Thin Films.
Gracia-Abad R, Sangiao S, Kumar Chaluvadi S, Orgiani P, Teresa JM.
Gracia-Abad R, et al.
Materials (Basel). 2023 Mar 10;16(6):2244. doi: 10.3390/ma16062244.
Materials (Basel). 2023.
PMID: 36984129
Free PMC article.
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