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Subpicometer length measurement using semiconductor laser tracking frequency gauge.
Opt Lett. 2011 Oct 1;36(19):3759-61. doi: 10.1364/OL.36.003759.
Opt Lett. 2011.
PMID: 21964088
Cavity length measurement: bias from misalignment and mismatching.
Reasenberg RD.
Reasenberg RD.
Appl Opt. 2013 Nov 20;52(33):8154-60. doi: 10.1364/AO.52.008154.
Appl Opt. 2013.
PMID: 24513772
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Aligning a reflection cavity by Anderson's method.
Reasenberg RD.
Reasenberg RD.
Appl Opt. 2012 Jun 1;51(16):3132-6. doi: 10.1364/AO.51.003132.
Appl Opt. 2012.
PMID: 22695543
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