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Spectroscopic ellipsometry studies on various zinc oxide films deposited by ion beam sputtering at room temperature.
Appl Opt. 2012 Mar 20;51(9):1209-15. doi: 10.1364/AO.51.001209.
Appl Opt. 2012.
PMID: 22441463
X-ray photoelectron spectroscopy study of thin TiO2 films cosputtered with Al.
Hsu JC, Wang PW, Lee CC.
Hsu JC, et al. Among authors: wang pw.
Appl Opt. 2006 Jun 20;45(18):4303-9. doi: 10.1364/ao.45.004303.
Appl Opt. 2006.
PMID: 16778939
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