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Page 1
Review on High-Throughput Micro-Combinatorial Characterization of Binary and Ternary Layers towards Databases.
Materials (Basel). 2023 Apr 10;16(8):3005. doi: 10.3390/ma16083005.
Materials (Basel). 2023.
PMID: 37109838
Free PMC article.
Review.
Investigation of the RF Sputtering Process and the Properties of Deposited Silicon Oxynitride Layers under Varying Reactive Gas Conditions.
Hegedüs N, Balázsi C, Kolonits T, Olasz D, Sáfrán G, Serényi M, Balázsi K.
Hegedüs N, et al. Among authors: serenyi m.
Materials (Basel). 2022 Sep 12;15(18):6313. doi: 10.3390/ma15186313.
Materials (Basel). 2022.
PMID: 36143625
Free PMC article.
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On the formation of blisters in annealed hydrogenated a-Si layers.
Serényi M, Frigeri C, Szekrényes Z, Kamarás K, Nasi L, Csik A, Khánh NQ.
Serényi M, et al.
Nanoscale Res Lett. 2013 Feb 15;8(1):84. doi: 10.1186/1556-276X-8-84.
Nanoscale Res Lett. 2013.
PMID: 23413996
Free PMC article.
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Micro-combinatorial sampling of the optical properties of hydrogenated amorphous [Formula: see text] for the entire range of compositions towards a database for optoelectronics.
Kalas B, Zolnai Z, Sáfrán G, Serényi M, Agocs E, Lohner T, Nemeth A, Khánh NQ, Fried M, Petrik P.
Kalas B, et al. Among authors: serenyi m.
Sci Rep. 2020 Nov 6;10(1):19266. doi: 10.1038/s41598-020-74881-5.
Sci Rep. 2020.
PMID: 33159099
Free PMC article.
Item in Clipboard
Relationship between structural changes, hydrogen content and annealing in stacks of ultrathin Si/Ge amorphous layers.
Frigeri C, Serényi M, Khánh NQ, Csik A, Riesz F, Erdélyi Z, Nasi L, Beke DL, Boyen HG.
Frigeri C, et al. Among authors: serenyi m.
Nanoscale Res Lett. 2011 Mar 1;6(1):189. doi: 10.1186/1556-276X-6-189.
Nanoscale Res Lett. 2011.
PMID: 21711697
Free PMC article.
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