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2023 | 2 |
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Page 1
Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range.
Micromachines (Basel). 2023 Oct 30;14(11):2018. doi: 10.3390/mi14112018.
Micromachines (Basel). 2023.
PMID: 38004876
Free PMC article.
Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs.
Tyaginov S, O'Sullivan B, Chasin A, Rawal Y, Chiarella T, de Carvalho Cavalcante CT, Kimura Y, Vandemaele M, Ritzenthaler R, Mitard J, Palayam SV, Reifsnider J, Kaczer B.
Tyaginov S, et al. Among authors: vandemaele m.
Micromachines (Basel). 2023 Jul 28;14(8):1514. doi: 10.3390/mi14081514.
Micromachines (Basel). 2023.
PMID: 37630050
Free PMC article.
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Correlated Time-0 and Hot-Carrier Stress Induced FinFET Parameter Variabilities: Modeling Approach.
Makarov A, Roussel P, Bury E, Vandemaele M, Spessot A, Linten D, Kaczer B, Tyaginov S.
Makarov A, et al. Among authors: vandemaele m.
Micromachines (Basel). 2020 Jun 30;11(7):657. doi: 10.3390/mi11070657.
Micromachines (Basel). 2020.
PMID: 32630139
Free PMC article.
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