Skip to main page content
U.S. flag

An official website of the United States government

Dot gov

The .gov means it’s official.
Federal government websites often end in .gov or .mil. Before sharing sensitive information, make sure you’re on a federal government site.

Https

The site is secure.
The https:// ensures that you are connecting to the official website and that any information you provide is encrypted and transmitted securely.

Access keys NCBI Homepage MyNCBI Homepage Main Content Main Navigation

Search Page

Filters

My NCBI Filters

Results by year

Table representation of search results timeline featuring number of search results per year.

Year Number of Results
2005 1
2006 1
2007 1
2008 1
2009 1
2016 1
2017 2
2018 1
2019 1
2020 1
2021 2
2022 2
2023 1
2024 0

Text availability

Article attribute

Article type

Publication date

Search Results

16 results

Results by year

Filters applied: . Clear all
Page 1
Skin tolerant inactivation of multiresistant pathogens using far-UVC LEDs.
Glaab J, Lobo-Ploch N, Cho HK, Filler T, Gundlach H, Guttmann M, Hagedorn S, Lohan SB, Mehnke F, Schleusener J, Sicher C, Sulmoni L, Wernicke T, Wittenbecher L, Woggon U, Zwicker P, Kramer A, Meinke MC, Kneissl M, Weyers M, Winterwerber U, Einfeldt S. Glaab J, et al. Among authors: weyers m. Sci Rep. 2021 Jul 19;11(1):14647. doi: 10.1038/s41598-021-94070-2. Sci Rep. 2021. PMID: 34282225 Free PMC article.
Displacement Talbot lithography for nano-engineering of III-nitride materials.
Coulon PM, Damilano B, Alloing B, Chausse P, Walde S, Enslin J, Armstrong R, Vézian S, Hagedorn S, Wernicke T, Massies J, Zúñiga-Pérez J, Weyers M, Kneissl M, Shields PA. Coulon PM, et al. Among authors: weyers m. Microsyst Nanoeng. 2019 Dec 2;5:52. doi: 10.1038/s41378-019-0101-2. eCollection 2019. Microsyst Nanoeng. 2019. PMID: 31814992 Free PMC article.
Author Correction: Skin tolerant inactivation of multiresistant pathogens using far-UVC LEDs.
Glaab J, Lobo-Ploch N, Cho HK, Filler T, Gundlach H, Guttmann M, Hagedorn S, Lohan SB, Mehnke F, Schleusener J, Sicher C, Sulmoni L, Wernicke T, Wittenbecher L, Woggon U, Zwicker P, Kramer A, Meinke MC, Kneissl M, Weyers M, Winterwerber U, Einfeldt S. Glaab J, et al. Among authors: weyers m. Sci Rep. 2022 May 11;12(1):7702. doi: 10.1038/s41598-022-11796-3. Sci Rep. 2022. PMID: 35545652 Free PMC article. No abstract available.
Imaging Threading Dislocations and Surface Steps in Nitride Thin Films Using Electron Backscatter Diffraction.
Hiller KP, Winkelmann A, Hourahine B, Starosta B, Alasmari A, Feng P, Wang T, Parbrook PJ, Zubialevich VZ, Hagedorn S, Walde S, Weyers M, Coulon PM, Shields PA, Bruckbauer J, Trager-Cowan C. Hiller KP, et al. Among authors: weyers m. Microsc Microanal. 2023 Dec 21;29(6):1879-1888. doi: 10.1093/micmic/ozad118. Microsc Microanal. 2023. PMID: 37947075
16 results