We propose an infrared-sensitive negative differential transconductance (NDT) phototransistor based on a graphene/WS2/Au double junction with a SiO2/Ge gate. By changing the drain bias, diverse field-effect characteristics can be achieved. Typical p-type and n-type behavior is obtained under negative and positive drain bias, respectively. And NDT behavior is observed in the transfer curves under positive drain bias. It is believed to originate from competition between the top and bottom channel currents in stepped layers of WS2 at different gate voltages. Moreover, this phototransistor shows a gate-modulated rectification ratio of 0.03 to 88.3. In optoelectronic experiments, the phototransistor exhibits a responsivity of 2.76 A/W under visible light at 532 nm. By contrast, an interesting negative responsivity of -29.5 µA/W is obtained and the NDT vanishes under illumination by infrared light at 1550 nm. A complementary inverter based on two proposed devices of the same structure is constructed. The maximum voltage gain of the complementary inverter reaches 0.79 at a supply voltage of 1.5 V. These results demonstrate a new method of realizing next-generation two- and three-dimensional electronic and optoelectronic multifunctional devices.