Unveiling Phonon Dispersion Behavior of AlN/GaN Heterostructures Using EELS
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):354-355.
doi: 10.1093/micmic/ozad067.165.
Authors
Joaquin E Reyes-González
1
,
Niklas Dellby
2
,
Benjamin Plotkin-Swing
2
,
Ping Wang
3
,
Ayush Pandey
3
,
Zetian Mi
3
,
Maureen J Lagos
1
4
Affiliations
1
Department of Materials Science and Engineering, McMaster University, Hamilton, Ontario, Canada.
2
Nion Co., Kirkland, Washington, United States.
3
Department of Electrical and Computer Engineering, University of Michigan, Ann Arbor, Michigan, United States.
4
Canadian Centre for Electron Microscopy, McMaster University, Hamilton, Ontario, Canada.
PMID:
37613497
DOI:
10.1093/micmic/ozad067.165
No abstract available