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Novel automatic electrochemical-mechanical polishing (ECMP) of metals for scanning electron microscopy.
Micron. 2010 Aug;41(6):615-21. doi: 10.1016/j.micron.2010.03.008. Epub 2010 Mar 30.
Micron. 2010.
PMID: 20434348
Measurement of gamma' precipitates in a nickel-based superalloy using energy-filtered transmission electron microscopy coupled with automated segmenting techniques.
Tiley JS, Viswanathan GB, Shiveley A, Tschopp M, Srinivasan R, Banerjee R, Fraser HL.
Tiley JS, et al.
Micron. 2010 Aug;41(6):641-7. doi: 10.1016/j.micron.2010.03.003. Epub 2010 Mar 19.
Micron. 2010.
PMID: 20434346
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