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Year | Number of Results |
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2006 | 1 |
2019 | 2 |
2021 | 2 |
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Page 1
Study of Graphene by Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy.
Microsc Microanal. 2023 Jul 22;29(Supplement_1):1861-1862. doi: 10.1093/micmic/ozad067.960.
Microsc Microanal. 2023.
PMID: 37613875
No abstract available.
Making Sense of Complex Carbon and Metal/Carbon Systems by Secondary Electron Hyperspectral Imaging.
Abrams KJ, Dapor M, Stehling N, Azzolini M, Kyle SJ, Schäfer J, Quade A, Mika F, Kratky S, Pokorna Z, Konvalina I, Mehta D, Black K, Rodenburg C.
Abrams KJ, et al. Among authors: konvalina i.
Adv Sci (Weinh). 2019 Aug 7;6(19):1900719. doi: 10.1002/advs.201900719. eCollection 2019 Oct 2.
Adv Sci (Weinh). 2019.
PMID: 31592411
Free PMC article.
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In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM.
Konvalina I, Mika F, Krátký S, Materna Mikmeková E, Müllerová I.
Konvalina I, et al.
Materials (Basel). 2019 Jul 19;12(14):2307. doi: 10.3390/ma12142307.
Materials (Basel). 2019.
PMID: 31330942
Free PMC article.
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Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer.
Konvalina I, Daniel B, Zouhar M, Paták A, Müllerová I, Frank L, Piňos J, Průcha L, Radlička T, Werner WSM, Mikmeková EM.
Konvalina I, et al.
Nanomaterials (Basel). 2021 Sep 18;11(9):2435. doi: 10.3390/nano11092435.
Nanomaterials (Basel). 2021.
PMID: 34578750
Free PMC article.
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Quantification of STEM Images in High Resolution SEM for Segmented and Pixelated Detectors.
Konvalina I, Paták A, Zouhar M, Müllerová I, Fořt T, Unčovský M, Materna Mikmeková E.
Konvalina I, et al.
Nanomaterials (Basel). 2021 Dec 28;12(1):71. doi: 10.3390/nano12010071.
Nanomaterials (Basel). 2021.
PMID: 35010021
Free PMC article.
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A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning.
Materna Mikmeková E, Materna J, Konvalina I, Mikmeková Š, Müllerová I, Asefa T.
Materna Mikmeková E, et al. Among authors: konvalina i.
Ultramicroscopy. 2024 Apr 10;262:113965. doi: 10.1016/j.ultramic.2024.113965. Online ahead of print.
Ultramicroscopy. 2024.
PMID: 38640578
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The trajectories of secondary electrons in the scanning electron microscope.
Konvalina I, Müllerová I.
Konvalina I, et al.
Scanning. 2006 Sep-Oct;28(5):245-56. doi: 10.1002/sca.4950280501.
Scanning. 2006.
PMID: 17063762
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