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A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements.
Beilstein J Nanotechnol. 2023 Nov 22;14:1141-1148. doi: 10.3762/bjnano.14.94. eCollection 2023.
Beilstein J Nanotechnol. 2023.
PMID: 38034476
Free PMC article.
Scanning microwave microscopy applied to semiconducting GaAs structures.
Buchter A, Hoffmann J, Delvallée A, Brinciotti E, Hapiuk D, Licitra C, Louarn K, Arnoult A, Almuneau G, Piquemal F, Zeier M, Kienberger F.
Buchter A, et al. Among authors: piquemal f.
Rev Sci Instrum. 2018 Feb;89(2):023704. doi: 10.1063/1.5015966.
Rev Sci Instrum. 2018.
PMID: 29495818
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Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy.
Piquemal F, Morán-Meza J, Delvallée A, Richert D, Kaja K.
Piquemal F, et al.
Nanomaterials (Basel). 2021 Mar 23;11(3):820. doi: 10.3390/nano11030820.
Nanomaterials (Basel). 2021.
PMID: 33806948
Free PMC article.
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Traceable Nanoscale Measurements of High Dielectric Constant by Scanning Microwave Microscopy.
Richert D, Morán-Meza J, Kaja K, Delvallée A, Allal D, Gautier B, Piquemal F.
Richert D, et al. Among authors: piquemal f.
Nanomaterials (Basel). 2021 Nov 17;11(11):3104. doi: 10.3390/nano11113104.
Nanomaterials (Basel). 2021.
PMID: 34835868
Free PMC article.
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