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Page 1
In situ, back-focal-plane-based determination of the numerical apertures in optical microscopes.
Appl Opt. 2023 Jan 20;62(3):756-763. doi: 10.1364/AO.472223.
Appl Opt. 2023.
PMID: 36821281
Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles.
Feltin N, Crouzier L, Delvallée A, Pellegrino F, Maurino V, Bartczak D, Goenaga-Infante H, Taché O, Marguet S, Testard F, Artous S, Saint-Antonin F, Salzmann C, Deumer J, Gollwitzer C, Koops R, Sebaïhi N, Fontanges R, Neuwirth M, Bergmann D, Hüser D, Klein T, Hodoroaba VD.
Feltin N, et al. Among authors: bergmann d.
Nanomaterials (Basel). 2023 Mar 9;13(6):993. doi: 10.3390/nano13060993.
Nanomaterials (Basel). 2023.
PMID: 36985886
Free PMC article.
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Using DNA origami nanorulers as traceable distance measurement standards and nanoscopic benchmark structures.
Raab M, Jusuk I, Molle J, Buhr E, Bodermann B, Bergmann D, Bosse H, Tinnefeld P.
Raab M, et al. Among authors: bergmann d.
Sci Rep. 2018 Jan 29;8(1):1780. doi: 10.1038/s41598-018-19905-x.
Sci Rep. 2018.
PMID: 29379061
Free PMC article.
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Tip wear and tip breakage in high-speed atomic force microscopes.
Strahlendorff T, Dai G, Bergmann D, Tutsch R.
Strahlendorff T, et al. Among authors: bergmann d.
Ultramicroscopy. 2019 Jun;201:28-37. doi: 10.1016/j.ultramic.2019.03.013. Epub 2019 Mar 22.
Ultramicroscopy. 2019.
PMID: 30925297
Free article.
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Nanomechanical Characterization of Vertical Nanopillars Using an MEMS-SPM Nano-Bending Testing Platform.
Li Z, Gao S, Brand U, Hiller K, Hahn S, Hamdana G, Peiner E, Wolff H, Bergmann D.
Li Z, et al. Among authors: bergmann d.
Sensors (Basel). 2019 Oct 18;19(20):4529. doi: 10.3390/s19204529.
Sensors (Basel). 2019.
PMID: 31635250
Free PMC article.
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A new type of nanoscale reference grating manufactured by combined laser-focused atomic deposition and x-ray interference lithography and its use for calibrating a scanning electron microscope.
Deng X, Dai G, Liu J, Hu X, Bergmann D, Zhao J, Tai R, Cai X, Li Y, Li T, Cheng X.
Deng X, et al. Among authors: bergmann d.
Ultramicroscopy. 2021 Jul;226:113293. doi: 10.1016/j.ultramic.2021.113293. Epub 2021 May 3.
Ultramicroscopy. 2021.
PMID: 33993000
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