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Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy.
Nanomaterials (Basel). 2021 Mar 23;11(3):820. doi: 10.3390/nano11030820.
Nanomaterials (Basel). 2021.
PMID: 33806948
Free PMC article.
Traceable Nanoscale Measurements of High Dielectric Constant by Scanning Microwave Microscopy.
Richert D, Morán-Meza J, Kaja K, Delvallée A, Allal D, Gautier B, Piquemal F.
Richert D, et al.
Nanomaterials (Basel). 2021 Nov 17;11(11):3104. doi: 10.3390/nano11113104.
Nanomaterials (Basel). 2021.
PMID: 34835868
Free PMC article.
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