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Page 1
Low-Temperature Plasma-Enhanced Atomic Layer Deposition of SiO2 Using Carbon Dioxide.
Nanoscale Res Lett. 2019 Feb 12;14(1):55. doi: 10.1186/s11671-019-2889-y.
Nanoscale Res Lett. 2019.
PMID: 30747362
Free PMC article.
On copper diffusion in silicon measured by glow discharge mass spectrometry.
Modanese C, Gaspar G, Arnberg L, Di Sabatino M.
Modanese C, et al.
Anal Bioanal Chem. 2014 Nov;406(29):7455-62. doi: 10.1007/s00216-014-8105-0. Epub 2014 Aug 22.
Anal Bioanal Chem. 2014.
PMID: 25146357
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Data of ALD Al2O3 rear surface passivation, Al2O3 PERC cell performance, and cell efficiency loss mechanisms of Al2O3 PERC cell.
Huang H, Lv J, Bao Y, Xuan R, Sun S, Sneck S, Li S, Modanese C, Savin H, Wang A, Zhao J.
Huang H, et al. Among authors: modanese c.
Data Brief. 2016 Dec 21;11:19-26. doi: 10.1016/j.dib.2016.12.030. eCollection 2017 Apr.
Data Brief. 2016.
PMID: 28127578
Free PMC article.
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Data of the recombination loss mechanisms analysis on Al2O3 PERC cell using PC1D and PC2D simulations.
Huang H, Lv J, Bao Y, Xuan R, Sun S, Sneck S, Li S, Modanese C, Savin H, Wang A, Zhao J.
Huang H, et al. Among authors: modanese c.
Data Brief. 2016 Dec 21;11:27-31. doi: 10.1016/j.dib.2016.12.031. eCollection 2017 Apr.
Data Brief. 2016.
PMID: 28127579
Free PMC article.
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