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Page 1
Calibration of the retardation inhomogeneity for the compensator-rotating imaging ellipsometer.
Appl Opt. 2019 Nov 20;58(33):9224-9229. doi: 10.1364/AO.58.009224.
Appl Opt. 2019.
PMID: 31873601
Extraction of polarization properties of the individual components of a layered system by using spectroscopic Mueller matrix analysis.
Jin L, Kobayashi D, Kondoh E, Kowa H, Gelloz B.
Jin L, et al. Among authors: gelloz b.
Opt Express. 2016 May 2;24(9):9757-65. doi: 10.1364/OE.24.009757.
Opt Express. 2016.
PMID: 27137590
Free article.
Item in Clipboard
Impact of Ag2O Content on the Optical and Spectroscopic Properties of Fluoro-Phosphate Glasses.
Ennouri M, Kuusela L, Jlassi I, Gelloz B, Petit L, Elhouichet H.
Ennouri M, et al. Among authors: gelloz b.
Materials (Basel). 2019 Oct 26;12(21):3516. doi: 10.3390/ma12213516.
Materials (Basel). 2019.
PMID: 31717751
Free PMC article.
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Correction of large retardation window effect for ellipsometry measurements using quasi-Newton method.
Jin L, Kasuga S, Kondoh E, Gelloz B.
Jin L, et al. Among authors: gelloz b.
Appl Opt. 2015 Apr 1;54(10):2991-8. doi: 10.1364/AO.54.002991.
Appl Opt. 2015.
PMID: 25967214
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Polarization properties of scattered light from macrorough surfaces.
Jin L, Kasahara M, Gelloz B, Takizawa K.
Jin L, et al. Among authors: gelloz b.
Opt Lett. 2010 Feb 15;35(4):595-7. doi: 10.1364/OL.35.000595.
Opt Lett. 2010.
PMID: 20160829
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Luminescence of mesoporous silicon powders treated by high-pressure water vapor annealing.
Gelloz B, Loni A, Canham L, Koshida N.
Gelloz B, et al.
Nanoscale Res Lett. 2012 Jul 11;7(1):382. doi: 10.1186/1556-276X-7-382.
Nanoscale Res Lett. 2012.
PMID: 22784665
Free PMC article.
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