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Page 1
Perspective of 2D Integrated Electronic Circuits: Scientific Pipe Dream or Disruptive Technology?
Adv Mater. 2022 Dec;34(48):e2201082. doi: 10.1002/adma.202201082. Epub 2022 Apr 10.
Adv Mater. 2022.
PMID: 35318749
Review.
Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range.
Tyaginov S, Bury E, Grill A, Yu Z, Makarov A, De Keersgieter A, Vexler M, Vandemaele M, Wang R, Spessot A, Chasin A, Kaczer B.
Tyaginov S, et al. Among authors: kaczer b.
Micromachines (Basel). 2023 Oct 30;14(11):2018. doi: 10.3390/mi14112018.
Micromachines (Basel). 2023.
PMID: 38004876
Free PMC article.
Item in Clipboard
Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs.
Tyaginov S, O'Sullivan B, Chasin A, Rawal Y, Chiarella T, de Carvalho Cavalcante CT, Kimura Y, Vandemaele M, Ritzenthaler R, Mitard J, Palayam SV, Reifsnider J, Kaczer B.
Tyaginov S, et al. Among authors: kaczer b.
Micromachines (Basel). 2023 Jul 28;14(8):1514. doi: 10.3390/mi14081514.
Micromachines (Basel). 2023.
PMID: 37630050
Free PMC article.
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Understanding the Origin of Metal Gate Work Function Shift and Its Impact on Erase Performance in 3D NAND Flash Memories.
Ramesh S, Ajaykumar A, Ragnarsson LÅ, Breuil L, El Hajjam GK, Kaczer B, Belmonte A, Nyns L, Soulié JP, Van den Bosch G, Rosmeulen M.
Ramesh S, et al. Among authors: kaczer b.
Micromachines (Basel). 2021 Sep 8;12(9):1084. doi: 10.3390/mi12091084.
Micromachines (Basel). 2021.
PMID: 34577727
Free PMC article.
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Correlated Time-0 and Hot-Carrier Stress Induced FinFET Parameter Variabilities: Modeling Approach.
Makarov A, Roussel P, Bury E, Vandemaele M, Spessot A, Linten D, Kaczer B, Tyaginov S.
Makarov A, et al. Among authors: kaczer b.
Micromachines (Basel). 2020 Jun 30;11(7):657. doi: 10.3390/mi11070657.
Micromachines (Basel). 2020.
PMID: 32630139
Free PMC article.
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