Micro-Raman Spectroscopy for Monitoring of Deposition Quality of High-k Stack Protective Layer onto Nanowire FET Chips for Highly Sensitive miRNA Detection

Biosensors (Basel). 2018 Jul 27;8(3):72. doi: 10.3390/bios8030072.

Abstract

Application of micro-Raman spectroscopy for the monitoring of quality of high-k (h-k) dielectric protective layer deposition onto the surface of a nanowire (NW) chip has been demonstrated. A NW chip based on silicon-on-insulator (SOI) structures, protected with a layer of high-k dielectric ((h-k)-SOI-NW chip), has been employed for highly sensitive detection of microRNA (miRNA) associated with oncological diseases. The protective dielectric included a 2-nm-thick Al₂O₃ surface layer and a 8-nm-thick HfO₂ layer, deposited onto a silicon SOI-NW chip. Such a chip had increased time stability upon operation in solution, as compared with an unprotected SOI-NW chip with native oxide. The (h-k)-SOI-NW biosensor has been employed for the detection of DNA oligonucleotide (oDNA), which is a synthetic analogue of miRNA-21 associated with oncological diseases. To provide biospecificity of the detection, the surface of (h-k)-SOI-NW chip was modified with oligonucleotide probe molecules (oDVA probes) complementary to the sequence of the target biomolecule. Concentration sensitivity of the (h-k)-SOI-NW biosensor at the level of DL~10-16 M has been demonstrated.

Keywords: high-k dielectric; miRNA; micro-Raman spectroscopy; nanowire biosensor; silicon-on-insulator.

MeSH terms

  • Aluminum Compounds / chemistry
  • Biosensing Techniques / instrumentation
  • Biosensing Techniques / methods*
  • Dielectric Spectroscopy / instrumentation
  • Dielectric Spectroscopy / methods
  • MicroRNAs / analysis*
  • Microchip Analytical Procedures / methods*
  • Nanowires / chemistry*
  • Silicon / chemistry
  • Spectrum Analysis, Raman / instrumentation
  • Spectrum Analysis, Raman / methods*
  • Transistors, Electronic

Substances

  • Aluminum Compounds
  • MicroRNAs
  • Silicon