Skip to main page content
U.S. flag

An official website of the United States government

Dot gov

The .gov means it’s official.
Federal government websites often end in .gov or .mil. Before sharing sensitive information, make sure you’re on a federal government site.

Https

The site is secure.
The https:// ensures that you are connecting to the official website and that any information you provide is encrypted and transmitted securely.

Access keys NCBI Homepage MyNCBI Homepage Main Content Main Navigation

Search Page

Filters

My NCBI Filters

Results by year

Table representation of search results timeline featuring number of search results per year.

Year Number of Results
2018 1
2019 2
2021 5
2023 2
2024 0

Text availability

Article attribute

Article type

Publication date

Search Results

10 results

Results by year

Filters applied: . Clear all
Page 1
Thickness measurements of graphene oxide flakes using atomic force microscopy: results of an international interlaboratory comparison.
Bu T, Gao H, Yao Y, Wang J, Pollard AJ, Legge EJ, Clifford CA, Delvallée A, Ducourtieux S, Lawn MA, Babic B, Coleman VA, Jämting Å, Zou S, Chen M, Jakubek ZJ, Iacob E, Chanthawong N, Mongkolsuttirat K, Zeng G, Almeida CM, He BC, Hyde L, Ren L. Bu T, et al. Among authors: delvallee a. Nanotechnology. 2023 Mar 16;34(22). doi: 10.1088/1361-6528/acbf58. Nanotechnology. 2023. PMID: 36848668
Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles.
Feltin N, Crouzier L, Delvallée A, Pellegrino F, Maurino V, Bartczak D, Goenaga-Infante H, Taché O, Marguet S, Testard F, Artous S, Saint-Antonin F, Salzmann C, Deumer J, Gollwitzer C, Koops R, Sebaïhi N, Fontanges R, Neuwirth M, Bergmann D, Hüser D, Klein T, Hodoroaba VD. Feltin N, et al. Among authors: delvallee a. Nanomaterials (Basel). 2023 Mar 9;13(6):993. doi: 10.3390/nano13060993. Nanomaterials (Basel). 2023. PMID: 36985886 Free PMC article.
Scanning microwave microscopy applied to semiconducting GaAs structures.
Buchter A, Hoffmann J, Delvallée A, Brinciotti E, Hapiuk D, Licitra C, Louarn K, Arnoult A, Almuneau G, Piquemal F, Zeier M, Kienberger F. Buchter A, et al. Among authors: delvallee a. Rev Sci Instrum. 2018 Feb;89(2):023704. doi: 10.1063/1.5015966. Rev Sci Instrum. 2018. PMID: 29495818
Correlative Analysis of the Dimensional Properties of Bipyramidal Titania Nanoparticles by Complementing Electron Microscopy with Other Methods.
Crouzier L, Feltin N, Delvallée A, Pellegrino F, Maurino V, Cios G, Tokarski T, Salzmann C, Deumer J, Gollwitzer C, Hodoroaba VD. Crouzier L, et al. Among authors: delvallee a. Nanomaterials (Basel). 2021 Dec 10;11(12):3359. doi: 10.3390/nano11123359. Nanomaterials (Basel). 2021. PMID: 34947708 Free PMC article.