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Table representation of search results timeline featuring number of search results per year.
Year | Number of Results |
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2006 | 1 |
2007 | 1 |
2019 | 1 |
2020 | 2 |
2022 | 1 |
2024 | 0 |
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Page 1
Photogrammetry-Based Volume Measurement Framework for the Particle Density Estimation of LECA.
Materials (Basel). 2022 Aug 5;15(15):5388. doi: 10.3390/ma15155388.
Materials (Basel). 2022.
PMID: 35955323
Free PMC article.
Automatic fringe pattern enhancement using truly adaptive period-guided bidimensional empirical mode decomposition.
Gocłowski P, Trusiak M, Ahmad A, Styk A, Mico V, Ahluwalia BS, Patorski K.
Gocłowski P, et al. Among authors: styk a.
Opt Express. 2020 Mar 2;28(5):6277-6293. doi: 10.1364/OE.382543.
Opt Express. 2020.
PMID: 32225880
Free article.
Item in Clipboard
On-Line Laser Triangulation Scanner for Wood Logs Surface Geometry Measurement.
Siekański P, Magda K, Malowany K, Rutkiewicz J, Styk A, Krzesłowski J, Kowaluk T, Zagórski A.
Siekański P, et al. Among authors: styk a.
Sensors (Basel). 2019 Mar 2;19(5):1074. doi: 10.3390/s19051074.
Sensors (Basel). 2019.
PMID: 30832388
Free PMC article.
Item in Clipboard
Full-field vibration profilometry using time-averaged interference microscopy aided by variational analysis.
Cywińska M, Trusiak M, Styk A, Patorski K.
Cywińska M, et al. Among authors: styk a.
Opt Express. 2020 Jan 6;28(1):435-450. doi: 10.1364/OE.28.000435.
Opt Express. 2020.
PMID: 32118970
Free article.
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Tilt-shift error detection in phase-shifting interferometry.
Patorski K, Styk A, Bruno L, Szwaykowski P.
Patorski K, et al. Among authors: styk a.
Opt Express. 2006 Jun 12;14(12):5232-49. doi: 10.1364/oe.14.005232.
Opt Express. 2006.
PMID: 19516689
Free article.
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Analysis of systematic errors in spatial carrier phase shifting applied to interferogram intensity modulation determination.
Styk A, Patorski K.
Styk A, et al.
Appl Opt. 2007 Jul 20;46(21):4613-24. doi: 10.1364/ao.46.004613.
Appl Opt. 2007.
PMID: 17609707
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