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1999 | 1 |
2007 | 1 |
2024 | 0 |
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High-temperature residual stresses in thin films characterized by x-ray diffraction substrate curvature method.
Rev Sci Instrum. 2007 Mar;78(3):036103. doi: 10.1063/1.2535857.
Rev Sci Instrum. 2007.
PMID: 17411228
Stability indicating assays for the determination of piroxicam--comparison of methods.
Bartsch H, Eiper A, Kopelent-Frank H.
Bartsch H, et al.
J Pharm Biomed Anal. 1999 Jul;20(3):531-41. doi: 10.1016/s0731-7085(98)90308-9.
J Pharm Biomed Anal. 1999.
PMID: 10701969
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