One-Step Passivation of Both Sulfur Vacancies and SiO2 Interface Traps of MoS2 Device.
Ahn B, Kim Y, Kim M, Yu HM, Ahn J, Sim E, Ji H, Gul HZ, Kim KS, Ihm K, Lee H, Kim EK, Lim SC.
Ahn B, et al. Among authors: kim ek, kim m, kim ks, kim y.
Nano Lett. 2023 Sep 13;23(17):7927-7933. doi: 10.1021/acs.nanolett.3c01753. Epub 2023 Aug 30.
Nano Lett. 2023.
PMID: 37647420