Defect-Engineered Semiconducting van der Waals Thin Film at Metal-Semiconductor Interface of Field-Effect Transistors.
Kim J, Rhee D, Jung M, Cheon GJ, Kim K, Kim JH, Park JY, Yoon J, Lim DU, Cho JH, Kim IS, Son D, Jariwala D, Kang J.
Kim J, et al. Among authors: kim is, kim k, kim jh.
ACS Nano. 2024 Jan 9;18(1):1073-1083. doi: 10.1021/acsnano.3c10453. Epub 2023 Dec 15.
ACS Nano. 2024.
PMID: 38100089