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Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of the Sample.
Nanomaterials (Basel). 2023 Aug 24;13(17):2407. doi: 10.3390/nano13172407.
Nanomaterials (Basel). 2023.
PMID: 37686915
Free PMC article.
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