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Waveguide-integrated silicon T centres.
DeAbreu A, Bowness C, Alizadeh A, Chartrand C, Brunelle NA, MacQuarrie ER, Lee-Hone NR, Ruether M, Kazemi M, Kurkjian ATK, Roorda S, Abrosimov NV, Pohl HJ, Thewalt MLW, Higginbottom DB, Simmons S. DeAbreu A, et al. Among authors: macquarrie er. Opt Express. 2023 Apr 24;31(9):15045-15057. doi: 10.1364/OE.482008. Opt Express. 2023. PMID: 37157355 Free article.
Optical observation of single spins in silicon.
Higginbottom DB, Kurkjian ATK, Chartrand C, Kazemi M, Brunelle NA, MacQuarrie ER, Klein JR, Lee-Hone NR, Stacho J, Ruether M, Bowness C, Bergeron L, DeAbreu A, Harrigan SR, Kanaganayagam J, Marsden DW, Richards TS, Stott LA, Roorda S, Morse KJ, Thewalt MLW, Simmons S. Higginbottom DB, et al. Among authors: macquarrie er. Nature. 2022 Jul;607(7918):266-270. doi: 10.1038/s41586-022-04821-y. Epub 2022 Jul 13. Nature. 2022. PMID: 35831600
Coherent Control and Spectroscopy of a Semiconductor Quantum Dot Wigner Molecule.
Corrigan J, Dodson JP, Ercan HE, Abadillo-Uriel JC, Thorgrimsson B, Knapp TJ, Holman N, McJunkin T, Neyens SF, MacQuarrie ER, Foote RH, Edge LF, Friesen M, Coppersmith SN, Eriksson MA. Corrigan J, et al. Among authors: macquarrie er. Phys Rev Lett. 2021 Sep 17;127(12):127701. doi: 10.1103/PhysRevLett.127.127701. Phys Rev Lett. 2021. PMID: 34597063
Ray-based framework for state identification in quantum dot devices.
Zwolak JP, McJunkin T, Kalantre SS, Neyens SF, MacQuarrie ER, Eriksson MA, Taylor JM. Zwolak JP, et al. Among authors: macquarrie er. PRX quantum. 2021 Jun 1;2(2):10.1103/PRXQuantum.2.020335. doi: 10.1103/PRXQuantum.2.020335. PRX quantum. 2021. PMID: 36733712 Free PMC article.
Autotuning of double dot devices in situ with machine learning.
Zwolak JP, McJunkin T, Kalantre SS, Dodson JP, MacQuarrie ER, Savage DE, Lagally MG, Coppersmith SN, Eriksson MA, Taylor JM. Zwolak JP, et al. Among authors: macquarrie er. Phys Rev Appl. 2020;13:10.1103/PhysRevApplied.13.034075. doi: 10.1103/PhysRevApplied.13.034075. Phys Rev Appl. 2020. PMID: 33304939 Free PMC article.
Fabrication process and failure analysis for robust quantum dots in silicon.
Dodson JP, Holman N, Thorgrimsson B, Neyens SF, MacQuarrie ER, McJunkin T, Foote RH, Edge LF, Coppersmith SN, Eriksson MA. Dodson JP, et al. Among authors: macquarrie er. Nanotechnology. 2020 Dec 11;31(50):505001. doi: 10.1088/1361-6528/abb559. Nanotechnology. 2020. PMID: 33043895
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