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Raman Scattering Measurement of Suspended Graphene under Extreme Strain Induced by Nanoindentation.
Adv Mater. 2022 Jul;34(30):e2200946. doi: 10.1002/adma.202200946. Epub 2022 Jun 16.
Adv Mater. 2022.
PMID: 35635443
Multifunctional van der Waals Broken-Gap Heterojunction.
Srivastava PK, Hassan Y, Gebredingle Y, Jung J, Kang B, Yoo WJ, Singh B, Lee C.
Srivastava PK, et al. Among authors: gebredingle y.
Small. 2019 Mar;15(11):e1804885. doi: 10.1002/smll.201804885. Epub 2019 Feb 7.
Small. 2019.
PMID: 30730094
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Exchange Bias Effect in Ferro-/Antiferromagnetic van der Waals Heterostructures.
Srivastava PK, Hassan Y, Ahn H, Kang B, Jung SG, Gebredingle Y, Joe M, Abbas MS, Park T, Park JG, Lee KJ, Lee C.
Srivastava PK, et al. Among authors: gebredingle y.
Nano Lett. 2020 May 13;20(5):3978-3985. doi: 10.1021/acs.nanolett.0c01176. Epub 2020 May 1.
Nano Lett. 2020.
PMID: 32330042
Retracted.
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Van der Waals Broken-Gap p-n Heterojunction Tunnel Diode Based on Black Phosphorus and Rhenium Disulfide.
Srivastava PK, Hassan Y, Gebredingle Y, Jung J, Kang B, Yoo WJ, Singh B, Lee C.
Srivastava PK, et al. Among authors: gebredingle y.
ACS Appl Mater Interfaces. 2019 Feb 27;11(8):8266-8275. doi: 10.1021/acsami.8b22103. Epub 2019 Feb 12.
ACS Appl Mater Interfaces. 2019.
PMID: 30698000
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Correction to Exchange Bias Effect in Ferro-/Antiferromagnetic van der Waals Heterostructures.
Srivastava PK, Hassan Y, Ahn H, Kang B, Jung SG, Gebredingle Y, Joe M, Abbas MS, Park T, Park JG, Lee KJ, Lee C.
Srivastava PK, et al. Among authors: gebredingle y.
Nano Lett. 2020 Jul 8;20(7):5590. doi: 10.1021/acs.nanolett.0c02127. Epub 2020 Jun 8.
Nano Lett. 2020.
PMID: 32510226
No abstract available.
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Retraction of "Exchange Bias Effect in Ferro-/Antiferromagnetic van der Waals Heterostructures".
Srivastava PK, Hassan Y, Ahn H, Kang B, Jung SG, Gebredingle Y, Joe M, Abbas MS, Park T, Park JG, Lee KJ, Lee C.
Srivastava PK, et al. Among authors: gebredingle y.
Nano Lett. 2020 Sep 9;20(9):6933. doi: 10.1021/acs.nanolett.0c02931. Epub 2020 Aug 11.
Nano Lett. 2020.
PMID: 32787150
No abstract available.
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