Self-aligned formation of sub 1 nm gaps utilizing electromigration during metal deposition.
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ACS Appl Mater Interfaces. 2013 Dec 26;5(24):12869-75. doi: 10.1021/am403115m. Epub 2013 Dec 4.
ACS Appl Mater Interfaces. 2013.
PMID: 24274822