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On the Correlation between Light-Induced Degradation and Minority Carrier Traps in Boron-Doped Czochralski Silicon.
ACS Appl Mater Interfaces. 2021 Feb 10;13(5):6140-6146. doi: 10.1021/acsami.0c17549. Epub 2021 Jan 26.
ACS Appl Mater Interfaces. 2021.
PMID: 33497179
Characterisation of negative-Udefects in semiconductors.
Coutinho J, Markevich VP, Peaker AR.
Coutinho J, et al. Among authors: markevich vp.
J Phys Condens Matter. 2020 May 12;32(32). doi: 10.1088/1361-648X/ab8091.
J Phys Condens Matter. 2020.
PMID: 32182607
Review.
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Thermal double donors and quantum dots.
Coutinho J, Jones R, Murin LI, Markevich VP, Lindström JL, Oberg S, Briddon PR.
Coutinho J, et al. Among authors: markevich vp.
Phys Rev Lett. 2001 Dec 3;87(23):235501. doi: 10.1103/PhysRevLett.87.235501. Epub 2001 Nov 14.
Phys Rev Lett. 2001.
PMID: 11736458
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