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Measurement of picometer-scale mirror dynamics.
Saif B, Chaney D, Greenfield P, Bluth M, Van Gorkom K, Smith K, Bluth J, Feinberg L, Wyant JC, North-Morris M, Keski-Kuha R. Saif B, et al. Among authors: wyant jc. Appl Opt. 2017 Aug 10;56(23):6457-6465. doi: 10.1364/AO.56.006457. Appl Opt. 2017. PMID: 29047935
Sub-picometer dynamic measurements of a diffuse surface.
Saif B, Greenfield P, North-Morris M, Bluth M, Feinberg L, Wyant JC, Keski-Kuha R. Saif B, et al. Among authors: wyant jc. Appl Opt. 2019 Apr 20;58(12):3156-3165. doi: 10.1364/AO.58.003156. Appl Opt. 2019. PMID: 31044790
Absolute measurement of surface roughness.
Creath K, Wyant JC. Creath K, et al. Among authors: wyant jc. Appl Opt. 1990 Sep 10;29(26):3823-7. doi: 10.1364/AO.29.003823. Appl Opt. 1990. PMID: 20567490
Rough surface interferometry at 10.6 microm.
Kwon O, Wyant JC, Hayslett CR. Kwon O, et al. Among authors: wyant jc. Appl Opt. 1980 Jun 1;19(11):1862-9. doi: 10.1364/AO.19.001862. Appl Opt. 1980. PMID: 20221137
55 results