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Low-Power, High-Performance, Non-volatile Inkjet-Printed HfO2-Based Resistive Random Access Memory: From Device to Nanoscale Characterization.
ACS Appl Mater Interfaces. 2019 Jul 3;11(26):23659-23666. doi: 10.1021/acsami.9b01731. Epub 2019 Jun 21.
ACS Appl Mater Interfaces. 2019.
PMID: 31180626
Current-limiting and ultrafast system for the characterization of resistive random access memories.
Diaz-Fortuny J, Maestro M, Martin-Martinez J, Crespo-Yepes A, Rodriguez R, Nafria M, Aymerich X.
Diaz-Fortuny J, et al. Among authors: crespo yepes a.
Rev Sci Instrum. 2016 Jun;87(6):064705. doi: 10.1063/1.4954973.
Rev Sci Instrum. 2016.
PMID: 27370480
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On the Aging of OTFTs and Its Impact on PUFs Reliability.
Porti M, Palau G, Crespo-Yepes A, Arnal Rus A, Ogier S, Ramon E, Nafria M.
Porti M, et al. Among authors: crespo yepes a.
Micromachines (Basel). 2024 Mar 26;15(4):443. doi: 10.3390/mi15040443.
Micromachines (Basel). 2024.
PMID: 38675255
Free PMC article.
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