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π/2 mode converters and vortex generators for electrons.
Kramberger C, Löffler S, Schachinger T, Hartel P, Zach J, Schattschneider P. Kramberger C, et al. Among authors: hartel p. Ultramicroscopy. 2019 Sep;204:27-33. doi: 10.1016/j.ultramic.2019.05.003. Epub 2019 May 17. Ultramicroscopy. 2019. PMID: 31125763
Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV.
Linck M, Hartel P, Uhlemann S, Kahl F, Müller H, Zach J, Haider M, Niestadt M, Bischoff M, Biskupek J, Lee Z, Lehnert T, Börrnert F, Rose H, Kaiser U. Linck M, et al. Among authors: hartel p. Phys Rev Lett. 2016 Aug 12;117(7):076101. doi: 10.1103/PhysRevLett.117.076101. Epub 2016 Aug 9. Phys Rev Lett. 2016. PMID: 27563976
On the residual six-fold astigmatism in DCOR/ASCOR.
Hartel P, Gerheim V, Linck M, Müller H, Uhlemann S, Zach Z, Haider M. Hartel P, et al. Ultramicroscopy. 2019 Nov;206:112821. doi: 10.1016/j.ultramic.2019.112821. Epub 2019 Aug 3. Ultramicroscopy. 2019. PMID: 31437673 Free article.
Transmission electron microscopy at 20 kV for imaging and spectroscopy.
Kaiser U, Biskupek J, Meyer JC, Leschner J, Lechner L, Rose H, Stöger-Pollach M, Khlobystov AN, Hartel P, Müller H, Haider M, Eyhusen S, Benner G. Kaiser U, et al. Among authors: hartel p. Ultramicroscopy. 2011 Jul;111(8):1239-46. doi: 10.1016/j.ultramic.2011.03.012. Epub 2011 Apr 1. Ultramicroscopy. 2011. PMID: 21801697
65 results