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Mechanical characterization of porous nano-thin films by use of atomic force acoustic microscopy.
Ultramicroscopy. 2016 Mar;162:82-90. doi: 10.1016/j.ultramic.2015.12.001. Epub 2015 Dec 9.
Ultramicroscopy. 2016.
PMID: 26799327
Mechanical characterization of nanoporous materials by use of atomic force acoustic microscopy methods.
Kopycinska-Müller M, Yeap KB, Mahajan S, Köhler B, Kuzeyeva N, Müller T, Zschech E, Wolter KJ.
Kopycinska-Müller M, et al. Among authors: yeap kb.
Nanotechnology. 2013 Sep 6;24(35):355703. doi: 10.1088/0957-4484/24/35/355703. Epub 2013 Aug 12.
Nanotechnology. 2013.
PMID: 23938222
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In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices.
Liao Z, Gall M, Yeap KB, Sander C, Clausner A, Mühle U, Gluch J, Standke Y, Aubel O, Beyer A, Hauschildt M, Zschech E.
Liao Z, et al. Among authors: yeap kb.
J Vis Exp. 2015 Jun 26;(100):e52447. doi: 10.3791/52447.
J Vis Exp. 2015.
PMID: 26167933
Free PMC article.
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