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Quantum conductance in silicon oxide resistive memory devices.
Mehonic A, Vrajitoarea A, Cueff S, Hudziak S, Howe H, Labbé C, Rizk R, Pepper M, Kenyon AJ. Mehonic A, et al. Among authors: kenyon aj. Sci Rep. 2013;3:2708. doi: 10.1038/srep02708. Sci Rep. 2013. PMID: 24048282 Free PMC article.
Electrically tailored resistance switching in silicon oxide.
Mehonic A, Cueff S, Wojdak M, Hudziak S, Labbé C, Rizk R, Kenyon AJ. Mehonic A, et al. Among authors: kenyon aj. Nanotechnology. 2012 Nov 16;23(45):455201. doi: 10.1088/0957-4484/23/45/455201. Epub 2012 Oct 12. Nanotechnology. 2012. PMID: 23064085
Nanoscale Transformations in Metastable, Amorphous, Silicon-Rich Silica.
Mehonic A, Buckwell M, Montesi L, Munde MS, Gao D, Hudziak S, Chater RJ, Fearn S, McPhail D, Bosman M, Shluger AL, Kenyon AJ. Mehonic A, et al. Among authors: kenyon aj. Adv Mater. 2016 Sep;28(34):7486-93. doi: 10.1002/adma.201601208. Epub 2016 Jun 23. Adv Mater. 2016. PMID: 27334656
X-ray spectromicroscopy investigation of soft and hard breakdown in RRAM devices.
Carta D, Guttmann P, Regoutz A, Khiat A, Serb A, Gupta I, Mehonic A, Buckwell M, Hudziak S, Kenyon AJ, Prodromakis T. Carta D, et al. Among authors: kenyon aj. Nanotechnology. 2016 Aug 26;27(34):345705. doi: 10.1088/0957-4484/27/34/345705. Epub 2016 Jul 15. Nanotechnology. 2016. PMID: 27420908 Free article.
98 results