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Comprehensive comparison of various techniques for the analysis of elemental distributions in thin films.
Microsc Microanal. 2011 Oct;17(5):728-51. doi: 10.1017/S1431927611000523. Epub 2011 Sep 12.
Microsc Microanal. 2011.
PMID: 21906418
Strongly reduced Si surface recombination by charge injection during etching in diluted HF/HNO3.
Greil SM, Schöpke A, Rappich J.
Greil SM, et al. Among authors: schopke a.
Chemphyschem. 2012 Aug 27;13(12):2982-8. doi: 10.1002/cphc.201200269. Epub 2012 Jul 3.
Chemphyschem. 2012.
PMID: 22761060
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