Chapman HN - Search Results

1

Single particle X-ray diffractive imaging.

Bogan MJ, Benner WH, Boutet S, Rohner U, Frank M, Barty A, Seibert MM, Maia F, Marchesini S, Bajt S, Woods B, Riot V, Hau-Riege SP, Svenda M, Marklund E, Spiller E, Hajdu J, Chapman HN. Bogan MJ, et al. Among authors: chapman hn. Nano Lett. 2008 Jan;8(1):310-6. doi: 10.1021/nl072728k. Epub 2007 Dec 21. Nano Lett. 2008. PMID: 18095739

2

Design and performance of capping layers for extreme-ultraviolet multilayer mirrors.

Bajt S, Chapman HN, Nguyen N, Alameda J, Robinson JC, Malinowski M, Gullikson E, Aquila A, Tarrio C, Grantham S. Bajt S, et al. Among authors: chapman hn. Appl Opt. 2003 Oct 1;42(28):5750-8. doi: 10.1364/ao.42.005750. Appl Opt. 2003. PMID: 14528939

3

Mo:Y multilayer mirror technology utilized to image the near-field output of a Ni-like Sn laser at 11.9 nm.

Nilsen J, Bajt S, Chapman HN, Staub F, Balmer J. Nilsen J, et al. Among authors: chapman hn. Opt Lett. 2003 Nov 15;28(22):2249-51. doi: 10.1364/ol.28.002249. Opt Lett. 2003. PMID: 14649957

4

SPEDEN: reconstructing single particles from their diffraction patterns.

Hau-Riege SP, Szoke H, Chapman HN, Szoke A, Marchesini S, Noy A, He H, Howells M, Weierstall U, Spence JC. Hau-Riege SP, et al. Among authors: chapman hn. Acta Crystallogr A. 2004 Jul;60(Pt 4):294-305. doi: 10.1107/S0108767304010293. Epub 2004 Jun 24. Acta Crystallogr A. 2004. PMID: 15218206

5

Repairing amplitude defects in multilayer-coated extreme-ultraviolet lithography reticles by use of a focused ion beam.

Barty A, Hau-Riege S, Stearns D, Clift M, Mirkarimi P, Gullikson E, Chapman H, Sweeney D. Barty A, et al. Appl Opt. 2004 Dec 20;43(36):6545-56. doi: 10.1364/ao.43.006545. Appl Opt. 2004. PMID: 15646775

6

Pulse requirements for x-ray diffraction imaging of single biological molecules.

Hau-Riege SP, London RA, Huldt G, Chapman HN. Hau-Riege SP, et al. Among authors: chapman hn. Phys Rev E Stat Nonlin Soft Matter Phys. 2005 Jun;71(6 Pt 1):061919. doi: 10.1103/PhysRevE.71.061919. Epub 2005 Jun 28. Phys Rev E Stat Nonlin Soft Matter Phys. 2005. PMID: 16089777

7

High-resolution ab initio three-dimensional x-ray diffraction microscopy.

Chapman HN, Barty A, Marchesini S, Noy A, Hau-Riege SP, Cui C, Howells MR, Rosen R, He H, Spence JC, Weierstall U, Beetz T, Jacobsen C, Shapiro D. Chapman HN, et al. J Opt Soc Am A Opt Image Sci Vis. 2006 May;23(5):1179-200. doi: 10.1364/josaa.23.001179. J Opt Soc Am A Opt Image Sci Vis. 2006. PMID: 16642197

8

Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter.

Hau-Riege SP, Chapman HN, Krzywinski J, Sobierajski R, Bajt S, London RA, Bergh M, Caleman C, Nietubyc R, Juha L, Kuba J, Spiller E, Baker S, Bionta R, Sokolowski Tinten K, Stojanovic N, Kjornrattanawanich B, Gullikson E, Plönjes E, Toleikis S, Tschentscher T. Hau-Riege SP, et al. Among authors: chapman hn. Phys Rev Lett. 2007 Apr 6;98(14):145502. doi: 10.1103/PhysRevLett.98.145502. Epub 2007 Apr 4. Phys Rev Lett. 2007. PMID: 17501285

9

Reflection of attosecond x-ray free electron laser pulses.

Hau-Riege SP, Chapman HN. Hau-Riege SP, et al. Among authors: chapman hn. Rev Sci Instrum. 2007 Jan;78(1):013104. doi: 10.1063/1.2428271. Rev Sci Instrum. 2007. PMID: 17503904 Free article.

10

Encapsulation and diffraction-pattern-correction methods to reduce the effect of damage in x-ray diffraction imaging of single biological molecules.

Hau-Riege SP, London RA, Chapman HN, Szoke A, Timneanu N. Hau-Riege SP, et al. Among authors: chapman hn. Phys Rev Lett. 2007 May 11;98(19):198302. doi: 10.1103/PhysRevLett.98.198302. Epub 2007 May 9. Phys Rev Lett. 2007. PMID: 17677667

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