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Lateral scanning confocal microscopy for the determination of in-plane displacements of microelectromechanical systems devices.
Opt Lett. 2007 Jun 15;32(12):1743-5. doi: 10.1364/ol.32.001743.
Opt Lett. 2007.
PMID: 17572766
Note: Nanomechanical characterization of soft materials using a micro-machined nanoforce transducer with an FIB-made pyramidal tip.
Li Z, Gao S, Brand U, Hiller K, Wollschläger N, Pohlenz F.
Li Z, et al. Among authors: pohlenz f.
Rev Sci Instrum. 2017 Mar;88(3):036104. doi: 10.1063/1.4977474.
Rev Sci Instrum. 2017.
PMID: 28372387
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A metrological large range atomic force microscope with improved performance.
Dai G, Wolff H, Pohlenz F, Danzebrink HU.
Dai G, et al. Among authors: pohlenz f.
Rev Sci Instrum. 2009 Apr;80(4):043702. doi: 10.1063/1.3109901.
Rev Sci Instrum. 2009.
PMID: 19405661
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