dc and ac resistivity of amorphous UCu4+xAl8-x thin films.
Lunkenheimer P, Kramer M, Viana R, Geibel C, Loidl A, Suski W, Ratajczak H, Gociaska I I, Luciski T.
Lunkenheimer P, et al.
Phys Rev B Condens Matter. 1994 Oct 1;50(13):9581-9584. doi: 10.1103/physrevb.50.9581.
Phys Rev B Condens Matter. 1994.
PMID: 9975015
No abstract available.