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Two-photon fluorescence surface wave microscopy.
Goh JY, Somekh MG, See CW, Pitter MC, Vere KA, O'Shea P. Goh JY, et al. Among authors: see cw. J Microsc. 2005 Dec;220(Pt 3):168-75. doi: 10.1111/j.1365-2818.2005.01525.x. J Microsc. 2005. PMID: 16364000
High-resolution scanning surface-plasmon microscopy.
Somekh MG, Liu S, Velinov TS, See CW. Somekh MG, et al. Among authors: see cw. Appl Opt. 2000 Dec 1;39(34):6279-87. doi: 10.1364/ao.39.006279. Appl Opt. 2000. PMID: 18354636
47 results