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Influence of substrate absorption on the optical and geometrical characterization of thin dielectric films.
Appl Opt. 2002 Dec 1;41(34):7300-8. doi: 10.1364/ao.41.007300.
Appl Opt. 2002.
PMID: 12477122
Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum.
Minkov D, Marquez E, Angelov G, Gavrilov G, Ruano S, Saugar E.
Minkov D, et al.
Materials (Basel). 2021 Aug 19;14(16):4681. doi: 10.3390/ma14164681.
Materials (Basel). 2021.
PMID: 34443203
Free PMC article.
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Hybrid Dispersion Model Characterization of PAZO Azopolymer Thin Films over the Entire Transmittance Spectrum Measured in the UV/VIS/NIR Spectral Region.
Minkov D, Nedelchev L, Angelov G, Marquez E, Blagoeva B, Mateev G, Nazarova D.
Minkov D, et al.
Materials (Basel). 2022 Dec 2;15(23):8617. doi: 10.3390/ma15238617.
Materials (Basel). 2022.
PMID: 36500112
Free PMC article.
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Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of the Sample.
Minkov D, Angelov G, Marquez E, Radonov R, Rusev R, Nikolov D, Ruano S.
Minkov D, et al.
Nanomaterials (Basel). 2023 Aug 24;13(17):2407. doi: 10.3390/nano13172407.
Nanomaterials (Basel). 2023.
PMID: 37686915
Free PMC article.
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Flow-graph approach for optical analysis of planar structures.
Minkov D.
Minkov D.
Appl Opt. 1994 Nov 20;33(33):7698-703. doi: 10.1364/AO.33.007698.
Appl Opt. 1994.
PMID: 20962978
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Optical Characterization of AsxTe100-x Films Grown by Plasma Deposition Based on the Advanced Optimizing Envelope Method.
Minkov D, Angelov G, Nestorov R, Nezhdanov A, Usanov D, Kudryashov M, Mashin A.
Minkov D, et al.
Materials (Basel). 2020 Jul 3;13(13):2981. doi: 10.3390/ma13132981.
Materials (Basel). 2020.
PMID: 32635359
Free PMC article.
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