Hydrogen-effusion-induced structural changes and defects in a-Si:H films: Dependence upon the film microstructure
Phys Rev B Condens Matter
.
1996 Feb 15;53(7):3804-3812.
doi: 10.1103/physrevb.53.3804.
Authors
K Zellama
,
L Chahed
,
P Sládek
,
ML Thèye
,
von Bardeleben JH
,
Roca i Cabarrocas P
PMID:
9983930
DOI:
10.1103/physrevb.53.3804
No abstract available