In situ characterization of epitaxially grown thin layers
Phys Rev B Condens Matter
.
1996 Apr 15;53(15):10200-10208.
doi: 10.1103/physrevb.53.10200.
Authors
Z Mitura
,
P Mazurek
,
K Paprocki
,
P Mikolajczak
,
JL Beeby
PMID:
9982588
DOI:
10.1103/physrevb.53.10200
No abstract available