Clustering effect and residual stress in InxGa1-xAs/GaAs strained layer grown by metal-organic chemical-vapor deposition
Phys Rev B Condens Matter
.
1995 Mar 15;51(12):7894-7897.
doi: 10.1103/physrevb.51.7894.
Authors
I Hwang I
,
C Lee
,
JE Kim
,
HY Park
,
E Suh
,
KY Lim
,
HJ Lee
PMID:
9977379
DOI:
10.1103/physrevb.51.7894
No abstract available