The remaining useful life (RUL) prediction of RF circuits is an important tool for circuit reliability. Data-driven-based approaches do not require knowledge of the failure mechanism and reduce the dependence on knowledge of complex circuits, and thus can effectively realize RUL prediction. This manuscript proposes a novel RUL prediction method based on a gated recurrent unit-convolutional neural network (GRU-CNN). Firstly, the data are normalized to improve the efficiency of the algorithm; secondly, the degradation of the circuit is evaluated using the hybrid health score based on the Euclidean and Manhattan distances; then, the life cycle of the RF circuits is segmented based on the hybrid health scores; and finally, an RUL prediction is carried out for the circuits at each stage using the GRU-CNN model. The results show that the RMSE of the GRU-CNN model in the normal operation stage is only 3/5 of that of the GRU and CNN models, while the prediction uncertainty is minimized.
Keywords: RF circuit; convolutional neural network (CNN); gated recurrent unit (GRU); reliability; remaining useful life (RUL).